A New Test Data Compression for Low Power Test
نویسندگان
چکیده
This paper proposes a new test data compression method for low power testing. To improve compression ratio, the proposed scheme uses the modified input reduction and novel techniques, a new scan flip-flop reordering algorithm and a newly proposed one block compression. The proposed method leads to better compression ratio with lower hardware overhead and lower power consumption than previous works. Experimental results validate efficiency of the proposed method.
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تاریخ انتشار 2005